An S, Sung B, Noh H, Stambaugh C, Kwon S, Lee K, Kim B, Kim Q, Jhe W. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope. Nano-Micro Lett [Internet]. 2014Jan.13 [cited 2024Nov.17];6(1):70-9. Available from: https://mail.nmlett.org/index.php/nml/article/view/639