Zhou Z, Ren Y, Yu F, Ma J. Electron Redistribution by Fluorine-Induced Dual Defects in Cu3P Accelerated Charge Transfer Toward High-Performance Electrochemical Chloride Ion Removal. Nano-Micro Lett [Internet]. 2026Jun.23 [cited 2026Jun.29];18:412. Available from: https://mail.nmlett.org/index.php/nml/article/view/2558