Yang Y, Xu S, Xie S, Peng L-M. Current sustainability and electromigration of Pd, Sc and Y thin-films as potential interconnects. Nano-Micro Lett [Internet]. 2010Sep.29 [cited 2024Nov.17];2(3):184-9. Available from: https://mail.nmlett.org/index.php/nml/article/view/125