AN, S.; SUNG, B.; NOH, H.; STAMBAUGH, C.; KWON, S.; LEE, K.; KIM, B.; KIM, Q.; JHE, W. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope. Nano-Micro Letters, [S. l.], v. 6, n. 1, p. 70-79, 2014. DOI: 10.1007/BF03353771. Disponível em: https://mail.nmlett.org/index.php/nml/article/view/639. Acesso em: 17 nov. 2024.