DENG, F.; WEI, J.; XU, Y.; LIN, Z.; LU, X.; WAN, Y.; SUN, R.; WONG, C.; HU, Y. Regulating the Electrical and Mechanical Properties of TaS2 Films via van der Waals and Electrostatic Interaction for High Performance Electromagnetic Interference Shielding. Nano-Micro Letters, [S. l.], v. 15, p. 106, 2023. DOI: 10.1007/s40820-023-01061-1. Disponível em: https://mail.nmlett.org/index.php/nml/article/view/1339. Acesso em: 17 nov. 2024.