CHUNG, D. S.; DAVIDSON‑HALL, T.; COTELLA, G.; LYU, Q.; CHUN, P.; AZIZ, H. Significant Lifetime Enhancement in QLEDs by Reducing Interfacial Charge Accumulation via Fluorine Incorporation in the ZnO Electron Transport Layer. Nano-Micro Letters, [S. l.], v. 14, p. 212, 2022. DOI: 10.1007/s40820-022-00970-x. Disponível em: https://mail.nmlett.org/index.php/nml/article/view/1209. Acesso em: 17 nov. 2024.