ZHENG, B.; GU, G. X. Machine Learning-Based Detection of Graphene Defects with Atomic Precision. Nano-Micro Letters, [S. l.], v. 12, p. 181, 2020. DOI: 10.1007/s40820-020-00519-w. Disponível em: https://mail.nmlett.org/index.php/nml/article/view/1. Acesso em: 17 nov. 2024.